BibTeX record conf/isqed/KanjJSKANMN07

• > Home > conf/isqed/KanjJSKANMN07

@inproceedings{DBLP:conf/isqed/KanjJSKANMN07,
  author       = {Rouwaida Kanj and
                  Rajiv V. Joshi and
                  Jayakumaran Sivagnaname and
                  Jente B. Kuang and
                  Dhruva Acharyya and
                  Tuyet Nguyen and
                  Chandler McDowell and
                  Sani R. Nassif},
  title        = {Gate Leakage Effects on Yield and Design Considerations of {PD/SOI}
                  {SRAM} Designs},
  booktitle    = {8th International Symposium on Quality of Electronic Design {(ISQED}
                  2007), 26-28 March 2007, San Jose, CA, {USA}},
  pages        = {33--40},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ISQED.2007.83},
  doi          = {10.1109/ISQED.2007.83},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/KanjJSKANMN07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}