BibTeX record conf/isqed/ElghazaliSO18

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@inproceedings{DBLP:conf/isqed/ElghazaliSO18,
  author       = {Mahdi Elghazali and
                  Manoj Sachdev and
                  Ajoy Opal},
  title        = {An {ESD} transient clamp with 494 pA leakage current in {GP} 65 nm
                  {CMOS} technology},
  booktitle    = {19th International Symposium on Quality Electronic Design, {ISQED}
                  2018, Santa Clara, CA, USA, March 13-14, 2018},
  pages        = {214--220},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ISQED.2018.8357290},
  doi          = {10.1109/ISQED.2018.8357290},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/ElghazaliSO18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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