BibTeX record conf/isocc/ChoLSK18

download as .bib file

@inproceedings{DBLP:conf/isocc/ChoLSK18,
  author       = {Keewon Cho and
                  Young{-}Woo Lee and
                  Sungyoul Seo and
                  Sungho Kang},
  title        = {2-D Failure Bitmap Compression Using Line Fault Marking Method},
  booktitle    = {International SoC Design Conference, {ISOCC} 2018, Daegu, South Korea,
                  November 12-15, 2018},
  pages        = {21--22},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ISOCC.2018.8649886},
  doi          = {10.1109/ISOCC.2018.8649886},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isocc/ChoLSK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.