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BibTeX record conf/isocc/ChoLSK18
@inproceedings{DBLP:conf/isocc/ChoLSK18, author = {Keewon Cho and Young{-}Woo Lee and Sungyoul Seo and Sungho Kang}, title = {2-D Failure Bitmap Compression Using Line Fault Marking Method}, booktitle = {International SoC Design Conference, {ISOCC} 2018, Daegu, South Korea, November 12-15, 2018}, pages = {21--22}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ISOCC.2018.8649886}, doi = {10.1109/ISOCC.2018.8649886}, timestamp = {Wed, 16 Oct 2019 14:14:55 +0200}, biburl = {https://dblp.org/rec/conf/isocc/ChoLSK18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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