BibTeX record conf/isie/PanHC16

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@inproceedings{DBLP:conf/isie/PanHC16,
  author       = {Siyi Pan and
                  Tzu{-}Yi Hung and
                  Liang{-}Tien Chia},
  title        = {Using material classification methods for steel surface defect inspection},
  booktitle    = {25th {IEEE} International Symposium on Industrial Electronics, {ISIE}
                  2016, Santa Clara, CA, USA, June 8-10, 2016},
  pages        = {40--45},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ISIE.2016.7744862},
  doi          = {10.1109/ISIE.2016.7744862},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/isie/PanHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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