BibTeX record conf/isie/DeviUP16

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@inproceedings{DBLP:conf/isie/DeviUP16,
  author       = {S. Jamuna Devi and
                  B. Umamaheswari and
                  R. Parthiban},
  title        = {Novel parametric tolerance based fault identification technique for
                  {PV} system},
  booktitle    = {25th {IEEE} International Symposium on Industrial Electronics, {ISIE}
                  2016, Santa Clara, CA, USA, June 8-10, 2016},
  pages        = {568--573},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ISIE.2016.7744952},
  doi          = {10.1109/ISIE.2016.7744952},
  timestamp    = {Thu, 14 Oct 2021 10:09:37 +0200},
  biburl       = {https://dblp.org/rec/conf/isie/DeviUP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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