BibTeX record conf/iscas/MooreWGF17

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@inproceedings{DBLP:conf/iscas/MooreWGF17,
  author       = {Conrad J. Moore and
                  Peikun Wang and
                  Amir Masoud Gharehbaghi and
                  Masahiro Fujita},
  title        = {Test pattern generation for multiple stuck-at faults not covered by
                  test patterns for single faults},
  booktitle    = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2017,
                  Baltimore, MD, USA, May 28-31, 2017},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ISCAS.2017.8050913},
  doi          = {10.1109/ISCAS.2017.8050913},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iscas/MooreWGF17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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