BibTeX record conf/irps/VandemaeleCBTGK20

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@inproceedings{DBLP:conf/irps/VandemaeleCBTGK20,
  author       = {Michiel Vandemaele and
                  Kai{-}Hsin Chuang and
                  Erik Bury and
                  Stanislav Tyaginov and
                  Guido Groeseneken and
                  Ben Kaczer},
  title        = {The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128218},
  doi          = {10.1109/IRPS45951.2020.9128218},
  timestamp    = {Sun, 12 Nov 2023 02:14:38 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/VandemaeleCBTGK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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