BibTeX record conf/irps/TheodorouIHPJDG15

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@inproceedings{DBLP:conf/irps/TheodorouIHPJDG15,
  author       = {Christoforos G. Theodorou and
                  Eleftherios G. Ioannidis and
                  S{\'{e}}bastien Haendler and
                  Nicolas Planes and
                  Emmanuel Josse and
                  Charalambos A. Dimitriadis and
                  G{\'{e}}rard Ghibaudo},
  title        = {New {LFN} and {RTN} analysis methodology in 28 and 14nm {FD-SOI} MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112833},
  doi          = {10.1109/IRPS.2015.7112833},
  timestamp    = {Sat, 30 Sep 2023 09:49:39 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/TheodorouIHPJDG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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