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BibTeX record conf/irps/TangCJBTWWM15
@inproceedings{DBLP:conf/irps/TangCJBTWWM15, author = {Baojun Tang and Kris Croes and Nicolas Jourdan and J{\"{u}}rgen B{\"{o}}mmels and Zsolt T{\"{o}}kei and Ingrid De Wolf and Eric Wilcox and Timothy McMullen}, title = {Constant voltage electromigration for advanced {BEOL} copper interconnects}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey, CA, USA, April 19-23, 2015}, pages = {2}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/IRPS.2015.7112685}, doi = {10.1109/IRPS.2015.7112685}, timestamp = {Fri, 02 Dec 2022 18:12:16 +0100}, biburl = {https://dblp.org/rec/conf/irps/TangCJBTWWM15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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