BibTeX record conf/irps/TajalliCNMSMZM19

download as .bib file

@inproceedings{DBLP:conf/irps/TajalliCNMSMZM19,
  author       = {Alaleh Tajalli and
                  Eleonora Canato and
                  Arianna Nardo and
                  Matteo Meneghini and
                  Arno Stockman and
                  Peter Moens and
                  Enrico Zanoni and
                  Gaudenzio Meneghesso},
  title        = {Impact of Sidewall Etching on the Dynamic Performance of GaN-on-Si
                  E-Mode Transistors},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720445},
  doi          = {10.1109/IRPS.2019.8720445},
  timestamp    = {Tue, 07 May 2024 20:11:33 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/TajalliCNMSMZM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.