BibTeX record conf/irps/ParkLKKCILCPSP15

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@inproceedings{DBLP:conf/irps/ParkLKKCILCPSP15,
  author       = {Jongwoo Park and
                  Miji Lee and
                  Hanbyul Kang and
                  Wooram Ko and
                  Eunkyeong Choi and
                  Junsik Im and
                  Minwoo Lee and
                  Dohwan Chung and
                  Jinchul Park and
                  Sangchul Shin and
                  Sangwoo Pae},
  title        = {Effects of front-end-of line process variations and defects on retention
                  failure of flash memory: Charge loss/gain mechanism},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112674},
  doi          = {10.1109/IRPS.2015.7112674},
  timestamp    = {Mon, 04 Mar 2024 14:32:59 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/ParkLKKCILCPSP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}