BibTeX record conf/irps/PariharSSWSM19

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@inproceedings{DBLP:conf/irps/PariharSSWSM19,
  author       = {Narendra Parihar and
                  Uma Sharma and
                  Richard G. Southwick and
                  Miaomiao Wang and
                  James H. Stathis and
                  Souvik Mahapatra},
  title        = {On the Frequency Dependence of Bulk Trap Generation During {AC} Stress
                  in Si and SiGe {RMG} P-FinFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720577},
  doi          = {10.1109/IRPS.2019.8720577},
  timestamp    = {Wed, 28 Jun 2023 16:23:50 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/PariharSSWSM19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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