BibTeX record conf/irps/MakarovKRCGVHEG19

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@inproceedings{DBLP:conf/irps/MakarovKRCGVHEG19,
  author       = {Alexander Makarov and
                  Ben Kaczer and
                  Philippe Roussel and
                  Adrian Vaisman Chasin and
                  Alexander Grill and
                  Michiel Vandemaele and
                  Geert Hellings and
                  Al{-}Moatasem El{-}Sayed and
                  Tibor Grasser and
                  Dimitri Linten and
                  Stanislav Tyaginov},
  title        = {Modeling the Effect of Random Dopants on Hot-Carrier Degradation in
                  FinFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720584},
  doi          = {10.1109/IRPS.2019.8720584},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/MakarovKRCGVHEG19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}