BibTeX record conf/irps/KothandaramanCM15

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@inproceedings{DBLP:conf/irps/KothandaramanCM15,
  author       = {Chandrasekharan Kothandaraman and
                  X. Chen and
                  Dan Moy and
                  D. Lea and
                  Sami Rosenblatt and
                  Faraz Khan and
                  Derek Leu and
                  Toshiaki Kirihata and
                  D. Ioannou and
                  Giuseppe La Rosa and
                  J. B. Johnson and
                  Norman Robson and
                  Subramanian S. Iyer},
  title        = {Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential
                  for embedded memory applications},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112816},
  doi          = {10.1109/IRPS.2015.7112816},
  timestamp    = {Fri, 08 Sep 2023 20:25:08 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/KothandaramanCM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}