BibTeX record conf/irps/JiKKLNJSKHCSPCD18

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@inproceedings{DBLP:conf/irps/JiKKLNJSKHCSPCD18,
  author       = {Younggeun Ji and
                  Jeonghoon Kim and
                  Jungin Kim and
                  Miji Lee and
                  Jaeheon Noh and
                  Taeyoung Jeong and
                  Juhyeon Shin and
                  Junho Kim and
                  Young Heo and
                  Ung Cho and
                  Hyun{-}Chul Sagong and
                  Junekyun Park and
                  Yeonsik Choo and
                  Gilhwan Do and
                  Hoyoung Kang and
                  Eunkyeong Choi and
                  Dongyoon Sun and
                  Changki Kang and
                  Sangchul Shin and
                  Sangwoo Pae},
  title        = {Reliability characterization of advanced {CMOS} image sensor {(CIS)}
                  with 3D stack and in-pixel {DTI}},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {3},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353570},
  doi          = {10.1109/IRPS.2018.8353570},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/JiKKLNJSKHCSPCD18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}