BibTeX record conf/irps/IgarashiUTYTS19

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@inproceedings{DBLP:conf/irps/IgarashiUTYTS19,
  author       = {Mitsuhiko Igarashi and
                  Yuuki Uchida and
                  Yoshio Takazawa and
                  Makoto Yabuuchi and
                  Yasumasa Tsukamoto and
                  Koji Shibutani},
  title        = {Study of Local {BTI} Variation and its Impact on Logic Circuit and
                  {SRAM} in 7 nm Fin-FET Process},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720508},
  doi          = {10.1109/IRPS.2019.8720508},
  timestamp    = {Thu, 14 Oct 2021 10:37:10 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/IgarashiUTYTS19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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