BibTeX record conf/irps/FrancoKRBMRGHTG15

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@inproceedings{DBLP:conf/irps/FrancoKRBMRGHTG15,
  author       = {Jacopo Franco and
                  Ben Kaczer and
                  Philippe J. Roussel and
                  Erik Bury and
                  Hans Mertens and
                  Romain Ritzenthaler and
                  Tibor Grasser and
                  Naoto Horiguchi and
                  Aaron Thean and
                  Guido Groeseneken},
  title        = {{NBTI} in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability
                  from planar to 3D architectures},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112694},
  doi          = {10.1109/IRPS.2015.7112694},
  timestamp    = {Sat, 19 Oct 2019 20:31:24 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/FrancoKRBMRGHTG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}