BibTeX record conf/irps/CartierFARN18

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@inproceedings{DBLP:conf/irps/CartierFARN18,
  author       = {Eduard Cartier and
                  Martin M. Frank and
                  Takashi Ando and
                  John Rozen and
                  Vijay Narayanan},
  title        = {{PBTI} in InGaAs {MOS} capacitors with Al2O3/HfO2/TiN gate stacks:
                  Interface-state generation},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2018, Burlingame,
                  CA, USA, March 11-15, 2018},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IRPS.2018.8353604},
  doi          = {10.1109/IRPS.2018.8353604},
  timestamp    = {Sat, 30 Sep 2023 09:49:38 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/CartierFARN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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