BibTeX record conf/irps/BuryCVBFKL19

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@inproceedings{DBLP:conf/irps/BuryCVBFKL19,
  author       = {Erik Bury and
                  Adrian Vaisman Chasin and
                  Michiel Vandemaele and
                  Simon Van Beek and
                  Jacopo Franco and
                  Ben Kaczer and
                  Dimitri Linten},
  title        = {Array-Based Statistical Characterization of {CMOS} Degradation Modes
                  and Modeling of the Time-Dependent Variability Induced by Different
                  Stress Patterns in the \{V\({}_{\mbox{G}}\), V\({}_{\mbox{D}}\)\}
                  bias space},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720592},
  doi          = {10.1109/IRPS.2019.8720592},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BuryCVBFKL19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}