BibTeX record conf/irps/BolshakovRQY19

download as .bib file

@inproceedings{DBLP:conf/irps/BolshakovRQY19,
  author       = {Pavel Bolshakov and
                  Rodolfo A. Rodriguez{-}Davila and
                  Manuel Quevedo{-}Lopez and
                  Chadwin D. Young},
  title        = {Positive Bias Instability in ZnO TFTs with Al2O3 Gate Dielectric},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2019, Monterey,
                  CA, USA, March 31 - April 4, 2019},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/IRPS.2019.8720547},
  doi          = {10.1109/IRPS.2019.8720547},
  timestamp    = {Sat, 19 Oct 2019 20:31:24 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BolshakovRQY19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.