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BibTeX record conf/irps/BezzaRRFMDHG15
@inproceedings{DBLP:conf/irps/BezzaRRFMDHG15, author = {A. Bezza and M. Rafik and David Roy and X. Federspiel and P. Mora and Cheikh Diouf and Vincent Huard and G{\'{e}}rard Ghibaudo}, title = {Physical understanding of low frequency degradation of {NMOS} {TDDB} in High-k metal gate stack-based technology. Implication on lifetime assessment}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey, CA, USA, April 19-23, 2015}, pages = {5}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/IRPS.2015.7112740}, doi = {10.1109/IRPS.2015.7112740}, timestamp = {Mon, 03 Jan 2022 22:37:46 +0100}, biburl = {https://dblp.org/rec/conf/irps/BezzaRRFMDHG15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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