BibTeX record conf/iolts/YiYISKF10

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@inproceedings{DBLP:conf/iolts/YiYISKF10,
  author       = {Hyunbean Yi and
                  Tomokazu Yoneda and
                  Michiko Inoue and
                  Yasuo Sato and
                  Seiji Kajihara and
                  Hideo Fujiwara},
  title        = {Aging test strategy and adaptive test scheduling for SoC failure prediction},
  booktitle    = {16th {IEEE} International On-Line Testing Symposium {(IOLTS} 2010),
                  5-7 July, 2010, Corfu, Greece},
  pages        = {21--26},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/IOLTS.2010.5560239},
  doi          = {10.1109/IOLTS.2010.5560239},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/YiYISKF10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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