BibTeX record conf/iolts/MaricauG09

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@inproceedings{DBLP:conf/iolts/MaricauG09,
  author       = {Elie Maricau and
                  Georges G. E. Gielen},
  title        = {A methodology for measuring transistor ageing effects towards accurate
                  reliability simulation},
  booktitle    = {15th {IEEE} International On-Line Testing Symposium {(IOLTS} 2009),
                  24-26 June 2009, Sesimbra-Lisbon, Portugal},
  pages        = {21--26},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/IOLTS.2009.5195978},
  doi          = {10.1109/IOLTS.2009.5195978},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/MaricauG09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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