BibTeX record conf/iolts/HobeikaPLTBA14

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@inproceedings{DBLP:conf/iolts/HobeikaPLTBA14,
  author       = {Christelle Hobeika and
                  Simon Pichette and
                  M. A. Leonard and
                  Claude Thibeault and
                  Jean{-}Fran{\c{c}}ois Boland and
                  Yves Audet},
  title        = {Multi-abstraction level signature generation and comparison based
                  on radiation single event upset},
  booktitle    = {2014 {IEEE} 20th International On-Line Testing Symposium, {IOLTS}
                  2014, Platja d'Aro, Girona, Spain, July 7-9, 2014},
  pages        = {212--215},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/IOLTS.2014.6873700},
  doi          = {10.1109/IOLTS.2014.6873700},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/HobeikaPLTBA14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}