BibTeX record conf/iolts/GuiterrezGL18

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@inproceedings{DBLP:conf/iolts/GuiterrezGL18,
  author       = {Valentin Guiterrez and
                  Antonio J. Gin{\'{e}}s and
                  Gildas L{\'{e}}ger},
  editor       = {Dimitris Gizopoulos and
                  Dan Alexandrescu and
                  Mihalis Maniatakos and
                  Panagiota Papavramidou},
  title        = {{AMS-RF} test quality: Assessing defect severity},
  booktitle    = {24th {IEEE} International Symposium on On-Line Testing And Robust
                  System Design, {IOLTS} 2018, Platja D'Aro, Spain, July 2-4, 2018},
  pages        = {23--28},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IOLTS.2018.8474109},
  doi          = {10.1109/IOLTS.2018.8474109},
  timestamp    = {Sat, 09 Apr 2022 12:38:45 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/GuiterrezGL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}