BibTeX record conf/iolts/AymerichABCCFGHMMPRRVVWZ11

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@inproceedings{DBLP:conf/iolts/AymerichABCCFGHMMPRRVVWZ11,
  author       = {Nivard Aymerich and
                  A. Asenov and
                  Andrew R. Brown and
                  Ramon Canal and
                  Binjie Cheng and
                  Joan Figueras and
                  Antonio Gonz{\'{a}}lez and
                  Enric Herrero and
                  S. Markov and
                  Miguel Miranda and
                  Peyman Pouyan and
                  Tanaus{\'{u}} Ram{\'{\i}}rez and
                  Antonio Rubio and
                  Elena I. Vatajelu and
                  Xavier Vera and
                  Xingsheng Wang and
                  Paul Zuber},
  title        = {New reliability mechanisms in memory design for sub-22nm technologies},
  booktitle    = {17th {IEEE} International On-Line Testing Symposium {(IOLTS} 2011),
                  13-15 July, 2011, Athens, Greece},
  pages        = {111--114},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/IOLTS.2011.5993820},
  doi          = {10.1109/IOLTS.2011.5993820},
  timestamp    = {Tue, 11 Jul 2023 07:28:29 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/AymerichABCCFGHMMPRRVVWZ11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}