BibTeX record conf/iolts/Asenov07

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@inproceedings{DBLP:conf/iolts/Asenov07,
  author       = {Asen Asenov},
  title        = {Statistical Device Variability and its Impact on Yield and Performance},
  booktitle    = {13th {IEEE} International On-Line Testing Symposium {(IOLTS} 2007),
                  8-11 July 2007, Heraklion, Crete, Greece},
  pages        = {253},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/IOLTS.2007.64},
  doi          = {10.1109/IOLTS.2007.64},
  timestamp    = {Thu, 23 Mar 2023 23:57:46 +0100},
  biburl       = {https://dblp.org/rec/conf/iolts/Asenov07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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