BibTeX record conf/ieem/ZhengX18

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@inproceedings{DBLP:conf/ieem/ZhengX18,
  author       = {Huiling Zheng and
                  Houbao Xu},
  title        = {Reliability Analysis for {MOSFET} Based on Wiener Process},
  booktitle    = {2018 {IEEE} International Conference on Industrial Engineering and
                  Engineering Management, {IEEM} 2018, Bangkok, Thailand, December 16-19,
                  2018},
  pages        = {197--201},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IEEM.2018.8607752},
  doi          = {10.1109/IEEM.2018.8607752},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/ieem/ZhengX18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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