BibTeX record conf/iecon/YuanO0Y18

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@inproceedings{DBLP:conf/iecon/YuanO0Y18,
  author       = {Xiaofeng Yuan and
                  Chen Ou and
                  Yalin Wang and
                  Chunhua Yang},
  title        = {Nonlinear {VW-SAE} Based Deep Learning for Quality-Related Feature
                  Learning and Soft Sensor Modeling},
  booktitle    = {{IECON} 2018 - 44th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Washington, DC, USA, October 21-23, 2018},
  pages        = {5400--5405},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IECON.2018.8591240},
  doi          = {10.1109/IECON.2018.8591240},
  timestamp    = {Thu, 18 Nov 2021 13:33:08 +0100},
  biburl       = {https://dblp.org/rec/conf/iecon/YuanO0Y18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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