BibTeX record conf/iecon/SoldatiCDBIB17

download as .bib file

@inproceedings{DBLP:conf/iecon/SoldatiCDBIB17,
  author       = {Alessandro Soldati and
                  Carlo Concari and
                  Fabrizio Dossena and
                  Davide Barater and
                  Francesco Iannuzzo and
                  Frede Blaabjerg},
  title        = {Active thermal control for reliability improvement of MOS-gated power
                  devices},
  booktitle    = {{IECON} 2017 - 43rd Annual Conference of the {IEEE} Industrial Electronics
                  Society, Beijing, China, October 29 - November 1, 2017},
  pages        = {7935--7940},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IECON.2017.8217391},
  doi          = {10.1109/IECON.2017.8217391},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/SoldatiCDBIB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.