BibTeX record conf/iecon/RenSG16

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@inproceedings{DBLP:conf/iecon/RenSG16,
  author    = {Lei Ren and
               Qian Shen and
               Chunying Gong},
  title     = {Real-time aging monitoring for power MOSFETs using threshold voltage},
  booktitle = {{IECON} 2016 - 42nd Annual Conference of the {IEEE} Industrial Electronics
               Society, Florence, Italy, October 23-26, 2016},
  pages     = {441--446},
  year      = {2016},
  crossref  = {DBLP:conf/iecon/2016},
  url       = {https://doi.org/10.1109/IECON.2016.7793625},
  doi       = {10.1109/IECON.2016.7793625},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iecon/RenSG16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/iecon/2016,
  title     = {{IECON} 2016 - 42nd Annual Conference of the {IEEE} Industrial Electronics
               Society, Florence, Italy, October 23-26, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7782522/proceeding},
  isbn      = {978-1-5090-3474-1},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/iecon/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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