BibTeX record conf/iecon/QiuZNW17

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@inproceedings{DBLP:conf/iecon/QiuZNW17,
  author       = {Zhijie Qiu and
                  Jin Zhang and
                  Puqi Ning and
                  Xuhui Wen},
  title        = {Reliability modeling and analysis of SiC {MOSFET} power modules},
  booktitle    = {{IECON} 2017 - 43rd Annual Conference of the {IEEE} Industrial Electronics
                  Society, Beijing, China, October 29 - November 1, 2017},
  pages        = {1459--1463},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/IECON.2017.8216248},
  doi          = {10.1109/IECON.2017.8216248},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/QiuZNW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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