BibTeX record conf/iecon/Li0ALY18

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@inproceedings{DBLP:conf/iecon/Li0ALY18,
  author       = {Kuan Li and
                  Hao Luo and
                  Baoran An and
                  Tianyu Liu and
                  Shen Yin},
  title        = {Closed-Loop Identification of the Data-Driven {SKR} with Deterministic
                  Disturbance for Fault Detection},
  booktitle    = {{IECON} 2018 - 44th Annual Conference of the {IEEE} Industrial Electronics
                  Society, Washington, DC, USA, October 21-23, 2018},
  pages        = {5365--5370},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/IECON.2018.8591264},
  doi          = {10.1109/IECON.2018.8591264},
  timestamp    = {Mon, 15 May 2023 16:24:40 +0200},
  biburl       = {https://dblp.org/rec/conf/iecon/Li0ALY18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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