BibTeX record conf/icst/PerrouinSKBT10

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@inproceedings{DBLP:conf/icst/PerrouinSKBT10,
  author       = {Gilles Perrouin and
                  Sagar Sen and
                  Jacques Klein and
                  Benoit Baudry and
                  Yves Le Traon},
  title        = {Automated and Scalable T-wise Test Case Generation Strategies for
                  Software Product Lines},
  booktitle    = {Third International Conference on Software Testing, Verification and
                  Validation, {ICST} 2010, Paris, France, April 7-9, 2010},
  pages        = {459--468},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/ICST.2010.43},
  doi          = {10.1109/ICST.2010.43},
  timestamp    = {Thu, 23 Mar 2023 23:58:21 +0100},
  biburl       = {https://dblp.org/rec/conf/icst/PerrouinSKBT10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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