BibTeX record conf/icse/KlasEMHG10

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@inproceedings{DBLP:conf/icse/KlasEMHG10,
  author    = {Michael Kl{\"{a}}s and
               Frank Elberzhager and
               J{\"{u}}rgen M{\"{u}}nch and
               Klaus Hartjes and
               Olaf von Graevemeyer},
  title     = {Transparent combination of expert and measurement data for defect
               prediction: an industrial case study},
  booktitle = {Proceedings of the 32nd {ACM/IEEE} International Conference on Software
               Engineering - Volume 2, {ICSE} 2010, Cape Town, South Africa, 1-8
               May 2010},
  pages     = {119--128},
  year      = {2010},
  crossref  = {DBLP:conf/icse/2010-2},
  url       = {https://doi.org/10.1145/1810295.1810313},
  doi       = {10.1145/1810295.1810313},
  timestamp = {Sat, 19 Oct 2019 20:20:04 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/icse/KlasEMHG10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/icse/2010-2,
  editor    = {Jeff Kramer and
               Judith Bishop and
               Premkumar T. Devanbu and
               Sebasti{\'{a}}n Uchitel},
  title     = {Proceedings of the 32nd {ACM/IEEE} International Conference on Software
               Engineering - Volume 2, {ICSE} 2010, Cape Town, South Africa, 1-8
               May 2010},
  publisher = {{ACM}},
  year      = {2010},
  timestamp = {Mon, 15 Jun 2015 19:00:08 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/icse/2010-2},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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