BibTeX record conf/iccel/HirakawaTN20

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@inproceedings{DBLP:conf/iccel/HirakawaTN20,
  author       = {Rin Hirakawa and
                  Keitaro Tominaga and
                  Yoshihisa Nakatoh},
  title        = {Study on Automatic Defect Report Classification System with Self Attention
                  Visualization},
  booktitle    = {2020 {IEEE} International Conference on Consumer Electronics (ICCE),
                  Las Vegas, NV, USA, January 4-6, 2020},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ICCE46568.2020.9043062},
  doi          = {10.1109/ICCE46568.2020.9043062},
  timestamp    = {Mon, 30 Mar 2020 16:24:53 +0200},
  biburl       = {https://dblp.org/rec/conf/iccel/HirakawaTN20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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