BibTeX record conf/iccel/Higuma16

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@inproceedings{DBLP:conf/iccel/Higuma16,
  author       = {Toshiyasu Higuma},
  title        = {Robustness estimation of electrical deterioration sensor},
  booktitle    = {{IEEE} International Conference on Consumer Electronics, {ICCE} 2016,
                  Las Vegas, NV, USA, January 7-11, 2016},
  pages        = {329--330},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/ICCE.2016.7430633},
  doi          = {10.1109/ICCE.2016.7430633},
  timestamp    = {Wed, 16 Oct 2019 14:14:51 +0200},
  biburl       = {https://dblp.org/rec/conf/iccel/Higuma16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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