BibTeX record conf/iccad/LiuCH17

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@inproceedings{DBLP:conf/iccad/LiuCH17,
  author       = {Ren{-}Shuo Liu and
                  Yun{-}Sheng Chang and
                  Chih{-}Wen Hung},
  editor       = {Sri Parameswaran},
  title        = {{VST:} {A} virtual stress testing framework for discovering bugs in
                  {SSD} flash-translation layers},
  booktitle    = {2017 {IEEE/ACM} International Conference on Computer-Aided Design,
                  {ICCAD} 2017, Irvine, CA, USA, November 13-16, 2017},
  pages        = {283--290},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ICCAD.2017.8203790},
  doi          = {10.1109/ICCAD.2017.8203790},
  timestamp    = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl       = {https://dblp.org/rec/conf/iccad/LiuCH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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