BibTeX record conf/fdtc/MadauABGHMRS0V18

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@inproceedings{DBLP:conf/fdtc/MadauABGHMRS0V18,
  author       = {Maxime Madau and
                  Michel Agoyan and
                  Josep Balasch and
                  Milos Grujic and
                  Patrick Haddad and
                  Philippe Maurine and
                  Vladimir Rozic and
                  Dave Singel{\'{e}}e and
                  Bohan Yang and
                  Ingrid Verbauwhede},
  title        = {The Impact of Pulsed Electromagnetic Fault Injection on True Random
                  Number Generators},
  booktitle    = {2018 Workshop on Fault Diagnosis and Tolerance in Cryptography, {FDTC}
                  2018, Amsterdam, The Netherlands, September 13, 2018},
  pages        = {43--48},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/FDTC.2018.00015},
  doi          = {10.1109/FDTC.2018.00015},
  timestamp    = {Fri, 24 Mar 2023 00:03:02 +0100},
  biburl       = {https://dblp.org/rec/conf/fdtc/MadauABGHMRS0V18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}