BibTeX record conf/ewdts/AndjelkovicSKK18

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@inproceedings{DBLP:conf/ewdts/AndjelkovicSKK18,
  author       = {Marko S. Andjelkovic and
                  Zoran Stamenkovic and
                  Milos Krstic and
                  Rolf Kraemer},
  title        = {Impact of Resistive Open and Bridge Defects on the {SET} Robustness
                  of Standard {CMOS} Combinational Logic},
  booktitle    = {2018 {IEEE} East-West Design {\&} Test Symposium, {EWDTS} 2018,
                  Kazan, Russia, September 14-17, 2018},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/EWDTS.2018.8524748},
  doi          = {10.1109/EWDTS.2018.8524748},
  timestamp    = {Mon, 05 Feb 2024 20:29:57 +0100},
  biburl       = {https://dblp.org/rec/conf/ewdts/AndjelkovicSKK18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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