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BibTeX record conf/ets/SchaaijkSM18
@inproceedings{DBLP:conf/ets/SchaaijkSM18, author = {Harm van Schaaijk and Martien Spierings and Erik Jan Marinissen}, title = {Automatic generation of in-circuit tests for board assembly defects}, booktitle = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany, May 28 - June 1, 2018}, pages = {1--2}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/ETS.2018.8400714}, doi = {10.1109/ETS.2018.8400714}, timestamp = {Mon, 05 Feb 2024 20:31:45 +0100}, biburl = {https://dblp.org/rec/conf/ets/SchaaijkSM18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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