BibTeX record conf/ets/RiusVM09

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@inproceedings{DBLP:conf/ets/RiusVM09,
  author    = {Josep Rius and
               Luis Elvira Villagra and
               Maurice Meijer},
  title     = {A Voltage-Mode Testing Method to Detect {IDDQ} Defects in Digital
               Circuits},
  booktitle = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
               25-29, 2009},
  pages     = {135--140},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://doi.org/10.1109/ETS.2009.34},
  doi       = {10.1109/ETS.2009.34},
  timestamp = {Tue, 28 Apr 2020 11:43:47 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/RiusVM09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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