BibTeX record conf/ets/MiyaseSBWK15

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@inproceedings{DBLP:conf/ets/MiyaseSBWK15,
  author       = {Kohei Miyase and
                  Matthias Sauer and
                  Bernd Becker and
                  Xiaoqing Wen and
                  Seiji Kajihara},
  title        = {Identification of high power consuming areas with gate type and logic
                  level information},
  booktitle    = {20th {IEEE} European Test Symposium, {ETS} 2015, Cluj-Napoca, Romania,
                  25-29 May, 2015},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/ETS.2015.7138773},
  doi          = {10.1109/ETS.2015.7138773},
  timestamp    = {Tue, 21 Mar 2023 20:55:30 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/MiyaseSBWK15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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