BibTeX record conf/ets/MedeirosTFPH19

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@inproceedings{DBLP:conf/ets/MedeirosTFPH19,
  author       = {Guilherme Cardoso Medeiros and
                  Mottaqiallah Taouil and
                  Moritz Fieback and
                  Leticia Bolzani Poehls and
                  Said Hamdioui},
  title        = {{DFT} Scheme for Hard-to-Detect Faults in FinFET SRAMs},
  booktitle    = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany,
                  May 27-31, 2019},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ETS.2019.8791517},
  doi          = {10.1109/ETS.2019.8791517},
  timestamp    = {Sat, 05 Sep 2020 18:05:52 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/MedeirosTFPH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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