BibTeX record conf/ets/Maxwell07

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@inproceedings{DBLP:conf/ets/Maxwell07,
  author       = {Peter C. Maxwell},
  title        = {Wafer Level Reliability Screens},
  booktitle    = {12th European Test Symposium, {ETS} 2007, Freiburg, Germany, May 20,
                  2007},
  pages        = {201},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/ETS.2007.45},
  doi          = {10.1109/ETS.2007.45},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/Maxwell07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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