BibTeX record conf/ets/MarinissenZKHHC16

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@inproceedings{DBLP:conf/ets/MarinissenZKHHC16,
  author    = {Erik Jan Marinissen and
               Yervant Zorian and
               Mario Konijnenburg and
               Chih{-}Tsun Huang and
               Ping{-}Hsuan Hsieh and
               Peter Cockburn and
               Jeroen Delvaux and
               Vladimir Rozic and
               Bohan Yang and
               Dave Singel{\'{e}}e and
               Ingrid Verbauwhede and
               Cedric Mayor and
               Robert Van Rijsinge and
               Cocoy Reyes},
  title     = {IoT: Source of test challenges},
  booktitle = {21th {IEEE} European Test Symposium, {ETS} 2016, Amsterdam, Netherlands,
               May 23-27, 2016},
  pages     = {1--10},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/ETS.2016.7519331},
  doi       = {10.1109/ETS.2016.7519331},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/ets/MarinissenZKHHC16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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