BibTeX record conf/ets/HosseinabadyLNCBP06

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@inproceedings{DBLP:conf/ets/HosseinabadyLNCBP06,
  author       = {Mohammad Hosseinabady and
                  Pejman Lotfi{-}Kamran and
                  Giorgio Di Natale and
                  Stefano Di Carlo and
                  Alfredo Benso and
                  Paolo Prinetto},
  title        = {Single-Event Upset Analysis and Protection in High Speed Circuits},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {29--34},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.41},
  doi          = {10.1109/ETS.2006.41},
  timestamp    = {Mon, 05 Feb 2024 20:31:45 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/HosseinabadyLNCBP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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