BibTeX record conf/ets/HanPLABWO09

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@inproceedings{DBLP:conf/ets/HanPLABWO09,
  author       = {Kihyuk Han and
                  Joonsung Park and
                  Jae Wook Lee and
                  Jacob A. Abraham and
                  Eonjo Byun and
                  Cheol{-}Jong Woo and
                  Sejang Oh},
  title        = {Low-Complexity Off-Chip Skew Measurement and Compensation Module {(SMCM)}
                  Design for Built-Off Test Chip},
  booktitle    = {14th {IEEE} European Test Symposium, {ETS} 2009, Sevilla, Spain, May
                  25-29, 2009},
  pages        = {129--134},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ETS.2009.20},
  doi          = {10.1109/ETS.2009.20},
  timestamp    = {Thu, 23 Mar 2023 23:58:22 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/HanPLABWO09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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