BibTeX record conf/ets/Arumi-DelgadoRG03

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@inproceedings{DBLP:conf/ets/Arumi-DelgadoRG03,
  author       = {Daniel Arum{\'{\i}}{-}Delgado and
                  Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
                  Jos{\'{e}} Pineda de Gyvez and
                  Guido Gronthoud},
  title        = {Process-variability aware delay fault testing of {\(\Delta\)}V\({}_{\mbox{T}}\)
                  and weak-open defects},
  booktitle    = {8th European Test Workshop, {ETW} 2003, Maastricht, The Netherlands,
                  May 25-28, 2003},
  pages        = {85--90},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/ETW.2003.1231673},
  doi          = {10.1109/ETW.2003.1231673},
  timestamp    = {Tue, 27 Jul 2021 11:50:52 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/Arumi-DelgadoRG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}