BibTeX record conf/ets/0001TKR18

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@inproceedings{DBLP:conf/ets/0001TKR18,
  author       = {Daniele Rossi and
                  Vasileios Tenentes and
                  S. Saqib Khursheed and
                  Sudhakar M. Reddy},
  title        = {Recycled {IC} detection through aging sensor},
  booktitle    = {23rd {IEEE} European Test Symposium, {ETS} 2018, Bremen, Germany,
                  May 28 - June 1, 2018},
  pages        = {1--2},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ETS.2018.8400713},
  doi          = {10.1109/ETS.2018.8400713},
  timestamp    = {Fri, 27 Mar 2020 08:59:12 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/0001TKR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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